Two-dimensional (2D) material flakes consist of single to few atomic layers, granting them extraordinary quantum properties, which are not observed in everyday materials. As a result, these materials ...

Spectroscopic ellipsometry is widely adopted in semiconductor processing, such as in the manufacturing of integrated circuits, flat display panels, and solar cells. However, a conventional ...

Left: Thickness image of MXene-based capacitive comb-structure devices (light contrast) on a silicon wafer with 100 nm oxide (red). Right: Two magnifications highlighting film homogeneity at the ...

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New Uvisel Plus includes the next generation of FastAcq technology with increased measurement accuracy. HORIBA Scientific, global leader in spectroscopic ellipsometry for over 25 years, announces the ...

Let us help you with your inquiries, brochures and pricing requirements Request A Quote Download PDF Copy Download Brochure The Accurion EP4, the latest imaging ...

The Film Sense FS-1 Multi-Wavelength Ellipsometer provides fast and reliable thin film measurements using long-life LEDs and a no-moving-parts ellipsometric detector. The film thickness of most ...

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